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PGI Optics Profilometers

Optical Profilometers for Surface Finish, Form Measurement in Optical Metrology

The Form Talysurf PGI Optics measuring instrumentsdeliver surface finish and form measurement of plastic lenses, spheres, aspheres, freeforms, IR glass & crystals and diffractives up to 300 mm in diameter. Our patented PGI (Phase Grating Interferometer) technology enables you to measure large sags with short length styli for the highest accuracy measurements. We designed PGI optical profilometers with powerful aspheric analysis software tools to improve your capacity and capability.

High performance Taylor Hobson Contact Optical Measurement Instruments are: Form Talysurf PGI Freeform, Form Talysurf PGI Matrix and Form Talysurf PGI Optics

(High performance & high accuracy Taylor Hobson 3D Non-contact Optical Measurement Systems are: LUPHOScan HD, LUPHOScan SD, LUPHOScan SL)


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Calibration Services

  • PGI Matrix +


    Optical Profilometer Form Talysurf PGI Matrix

    The Form Talysurf® PGI Matrix is a fully automated, fast and accurate stylus optical profilometerfor single or multiple optical components surface form measurement. The system is the perfect all-around instrument for fully automated 2D and 3D form metrology of optics ranging from small, mobile phone lenses to large astronomy optics. read more.

  • Talysurf PGI Optics +


    Optical Profilometer Form Talysurf PGI Optics

    The Form Talysurf® PGI Optics is the ideal contact stylus optical surface profilometer for 'in-process' inspection at all stages of optics manufacture, from rough ground to fine polished. It is the number one choice for optics manufacturers measuring aspheric form error.
    read more.

  • PGI Freeform +


    Optical Profilometer Form Talysurf PGI Freeform

    The Form Talysurf® PGI Freeform is a versatile, high resolution optical profilometer dedicated to the measurement of high precision freeform optics. This freeform optics measurement system can measure any optical surface form in true 3D, there is no part design information required to make these measurements.read more.