The LUPHOScan HD platforms are interferometric, scanning metrology systems based on MWLI® technology (multi-wavelength interferometry).
They are designed to perform ultra precision non-contact 3D form measurements of rotationally symmetric surfaces such as aspheric lenses, spheres, flats and freeforms.
Key benefits of the LUPHOScan HD include fast measurement speeds, high flexibility with regard to uncommon surface shapes (e.g. flat apexes or profiles with points of inflection), and maximum object diameters up to 420 mm.
Revolutionary measurement and analysis capability
- Analysis of any rotationally symmetric surface - Aspheres, spheres, flats and freeforms
- Highest accuracy on object slopes up to 90° - Ideal for measuring strong, steep, and small aspheres including cell phone lens moulds
- Measurement of almost any material - Transparent, specular, opaque, polished, ground
- Large spherical departures - Measure pancake or gullwing surfaces and profiles with points of inflection
- Excellent reproducibility of measurement results - Best shot-to-shot stability of Power and PV determination
- Very low system noise - Robust against environmental variations
- Fast measurement speeds - On diameters up to 420 mm
This next generation LUPHOScan with low noise floor delivers an absolute measurement accuracy of better than ±50 nm (3σ) up to 90° of object slope.
The non-contact 3D form profilometer/instrument is ideal for applications where high accuracy and repeatability are essential to the manufacturing process. This is most beneficial for surfaces with steep slopes, varying pitch directions and small surfaces. By a significant reduction in noise and enhanced reproducibility, Taylor Hobson has addressed the rapidly advancing needs of lens designers and manufacturers.
LUPHOSwap - Complete form error characterisation of optical parts
The LUPHOSwap extends the capability of the LUPHOScan platforms, enabling complete characterisation of both surfaces of a lens. The two surfaces are measured successively. A unique measurement concept that enables absolute correlation of the results measured on both sides. As the form errors are measured, the LUPHOSwap determines the exact lens thickness, the wedge and decentre errors of the two surfaces and their rotational orientation.
In addition, the lens–mount positioning can be assessed. The LUPHOSwap is based on the absolute measurement capability of the LUPHOSmart sensor technology, a unique holder concept, and on an additional (runout) reference sensor.