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  • Surface Profiling Solutions from Taylor Hobson

    Tuesday, September 18, 2018 |

    Surface profilers are used to measure and characterize the surface features of a material on the micro- and nanoscale. These minute topographical features are typically categorized as roughness, waviness, or directional lay, representing potentially microscopic structure superimposed on the true form of a material’s substrate.

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  • What is a Surface Profiler

    Wednesday, July 18, 2018 |

    A surface profiler is a metrological instrument for topographical characterization of a product’s uppermost layers. It is a multipoint form of measurement that considers a material’s primary form and the sub-micron (μm) textural variations of its surface, which are typically characterized as dimensional fractality and surface roughness. These features may contribute to a directional lay, or a pattern, which can have a distinct impact on the physical properties of the material under observation.

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