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3D
Measurement of MicroLens Arrays
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Overview
Microlens Arrays are a relatively new technology which are now widely
used for such applications as Optical Switching, DWDM and Waveguides. |
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With
individual lenses as small as 15um Ø, the measurement
of sub-micron form errors and Angstrom-level surface finish
creates
a uniquely challenging metrology requirement.
The
Talysurf CCI 3000 meets this challenge with it’s world-beating
specification. Detailed
in the Talysurf links below.
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Talysurf
CCI Systems
Non-Contact
3D Measurement System using patented Coherence Correlation Interferometer.
Resolution 0.1Å, Z-Range 100um, X-Y Measurement Area 7.2mm2.
Delivers market-leading surface roughness measurement capability
for a wide range
of MEMS components, including optics. |
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TalyMap
3D Analysis Software
Talymap has
been designed specifically for the metrology industry and
has many operations supplied; zoom, filtering, levelling by least
square line removal, symmetries, rotations, threshold setting and
cylindrical, spherical or polynomial form removal and much more.
2D profiles can be extracted and exported to Aspherics Analysis
Utility (see below). |
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Aspherics
Analysis Software Utility
In-depth analysis
of Aspheric Optics, using Taylor Hobson’s renowned algorithm
capability. Form Error & Surface Finish Parameters, SAG Tables
and Astigmatism Analysis supplied as standard with PGI Aspherics
Systems. Also available is a unique Derived Coefficients module,
allowing the aspheric data to be calculated directly from the component. |
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If
you do not see optics metrology solutions directly relevant to
your specific requirements, please
contact your local Taylor Hobson Sales Office. We have a highly
skilled team of Applications Engineers who can create custom systems
for this and many other high precision
industries.
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