|
| |
IC
Package Measurement
|
Overview
Backend process measurement is important for controlling the final
quality of the IC package. Problems in IC packaging can cause
connection issues when the device is soldered, detaching of
wire bonds or bump on chip contacts and increased stress to
be placed on the circuits of the IC. For these reasons it is
important to control not just the geometry of the die, but
also the flatness of the die seating area, the step height
between the attachment points on the die and the package and
the roughness of the wire bond attachment areas.
The products
include: |
 |
Talysurf
CCI 3000A
High speed non-contact
3D metrology system delivering 1 million measurement points over
an area up to 7mm x 7mm. For the measurement of contact flatness,
roughness, micro dimensions and step height with repeatability
up to 0.1nm. |
 |
Talysurf
CLI 2000
Scanning 3D
profiler combining contact stylus, laser triangulation and chromatic
confocal measurement sensors. Offering 200mm x 200mm maximum scanning
area, up to 3mm vertical range and down to 0.01µm vertical
resolution. |
| |
Metrology |
| |
Flatness
Matching
the flatness of the die with that of the die seating area is important
to reduce stress placed on the IC during the packaging process
and throughout the operation of the device. Controlling the flatness
of the overall package is also necessary to ensure correct placement
of the IC and good electrical contact being made when soldered.
|
| |
Roughness
The surface
finish of the die seating area needs to be controlled to ensure
good adhesion when the die is attached. Also the roughness of the
wire bond attachment areas is important for good electrical conductivity
and wire attachment security. |
| |
Step
Height
There are many
application for step height on the IC package. From the measurement
of balls, bumps and leads to the package geometry itself including
depth of the die seating area.
|
| |
For
further details contact your local sales representative |
| |
|