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Hard Disk, MEMS & Semiconductor Applications
Hard Disc Media (disks) Laser Etch Measurement
Hard Disk Heads (sliders) Epitaxial Wafers
Step Height IC Package Measurement
MEMS & Nanotechnology  
 

Epiwafer Measurement

Overview
Due to the expansion in the use of electro-optical components that are now common place in both telecommunications and display technologies, epitaxy is emerging as a key technique for component production. Epitaxy is the process of depositing very thin layers of semiconductor materials onto the surface of a single crystal substrate. Each crystal layer is known as an epilayer.

  Hard Disk, MEMS & Semiconductor Applications - Epitaxial wafers - Talysurf CCI 3000A Talysurf CCI Systems
High speed non-contact 3D metrology system with 10pm (0.01nm) resolution and
1 million measurement points. For the measurement of wafer roughness from micron
to angstrom levels.
  Metrology
 

Surface Roughness
Surface texture is a vitally important parameter in specifying the quality of epitaxial semiconductors for both customers and suppliers. With the current drive for ever smaller circuits to be printed on wafers, the tolerances for roughness are becoming tighter. Surface finish for epiwafers is specified in nm, this requires a system with very low noise and high resolution be used to measure them.

   For further details contact your local sales representative 
   
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