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| Hard
Disk, MEMS & Semiconductor
Applications |
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| Today’s hard disk drives, MEMS and semiconductor devices are not just testing the limits of current fabrication processes but also the metrology used to monitor them. The drive for higher yields on smaller geometry’s with tighter tolerances requires the very best metrology for step height, roughness and micro dimensional measurement. Taylor Hobson develops metrology solutions for these critical measurements for both R&D and custom fab solutions for in process measurement. | |
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Click on one of the buttons below to find more about your particular application
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| If you do not see the metrology solutions directly relevant to your specific requirements, please contact your local Taylor Hobson Sales Office. We have a highly skilled team of Applications Engineers who can create custom systems for this and many other high precision industries. |
