News & Exhibitions

19/08/10
Free Non Contact 3D Measurement from Taylor Hobson

Can your parts be measured using non contact 3D?

Taylor Hobson are offering free sample measurements at any of their Centre of Excellence technical facilities worldwide. Roughness, form and film thickness analysis are all possible so don't be shy, send in your samples!

Talysurf CCI Application Examples
Silicon WaferCCI Trench in SiliconSilicon WaferPolymer Scratches
CCI moulded component CCI Textured Steel CCI Watch Face CCI De-pixelator
CCI nano structure CCI Optics turning marks CCI Raster Polishing CCI mems accelerometer

How to send your samples

Please send your samples to the nearest Centre of Excellence facility enclosing the attached application form.

If you have any questions regarding this opportunity (e.g. where to send your sample, confidentiality, sample suitability) please contact Mike Conroy: mike.conroy@ametek.co.uk

Centre of Excellence facilities:

Europe

Maik Meyer
Taylor Hobson GERMANY
Postfach 4827, Kreuzberger Ring 6
65205 Wiesbaden, Germany

USA

Non-Contact Divison
Chris Orsulak
Taylor Hobson Inc.
a division of AMETEK
1725 Western Drive
West Chicago, IL 60185

China

Kevin Peng
Taylor Hobson Ltd
AMETEK Shanghai Office
Part A, 1st Floor,
Waigaoqiao Free Trade Zone,
SHANGHAI, 200131,
CHINA


Chris White
Taylor Hobson Ltd
PO Box 36, 2 New Star Road
Leicester, LE4 9JQ,
United Kingdom
Japan

Takeshi Hashimoto
Taylor Hobson Japan
Sankyo Meguro Building 4-5-37,
Kamiosaki, Shinagawa-Ku, Tokyo 141-0021
Japan

India

Arun Kumar
AMETEK INSTRUMENTS INDIA PRIVATE LIMITED
Prestige Featherlite Tech Park,
Plot No.148, 1st floor,EPIP 2nd Phase, Whitefield,
BANGALORE - 560066
INDIA

click to download the CCI Measurement Request Form

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